The WFD22 is a 22 bit Waveform Digitizer for medium-speed / high resolution waveform capturing and analyzing. It combines superior dynamic performance with a very high DC accuracy.
The module features fully differential inputs to reduce common-mode level disturbances. It can also be used in Single Ended mode where an internal DC-offset source sets the midscale level. In this mode the negative input can be used as a GND Sense input, so the DC performance won’t be compromised due to ground currents. The user can select between a 100 MΩ low bias current input for highest absolute accuracy, or a 1 MΩ ultra-low noise input for highest dynamic performance. There are 10 input ranges from 0.425 Vpp to 10.2 Vpp, which allows easy adaptation to a wide range of Device Under Test output voltages. A filter-bank with 3 Low Pass filters (40 kHz, 250 kHz and 500 kHz) provides excellent signal conditioning resulting in lower noise and proper anti-aliasing.
Our proprietary technology combines four 20 bit ADCs to create an advanced 22 bit converter. This results in excellent SNR and linearity with a resolution down to 0.1 µV. The large capture memory of 32M-word (96 MB) allows capturing long waveforms. This can be very useful when a high number of averages is required. All these features together result in the highest accuracy available when performing analog measurements. DAC linearity and dynamic performance measurements are a breeze with the WFD22 in the ATX7006 system. Also applications like: Power meter testing, MRI amplifier test, Quantum effect research, etc. will benefit from the outstanding analog performance of the WFD22.
The module features fully differential inputs to reduce common-mode level disturbances. It can also be used in Single Ended mode where an internal DC-offset source sets the midscale level. In this mode the negative input can be used as a GND Sense input, so the DC performance won’t be compromised due to ground currents. The user can select between a 100 MΩ low bias current input for highest absolute accuracy, or a 1 MΩ ultra-low noise input for highest dynamic performance. There are 10 input ranges from 0.425 Vpp to 10.2 Vpp, which allows easy adaptation to a wide range of Device Under Test output voltages. A filter-bank with 3 Low Pass filters (40 kHz, 250 kHz and 500 kHz) provides excellent signal conditioning resulting in lower noise and proper anti-aliasing.
Our proprietary technology combines four 20 bit ADCs to create an advanced 22 bit converter. This results in excellent SNR and linearity with a resolution down to 0.1 µV. The large capture memory of 32M-word (96 MB) allows capturing long waveforms. This can be very useful when a high number of averages is required. All these features together result in the highest accuracy available when performing analog measurements. DAC linearity and dynamic performance measurements are a breeze with the WFD22 in the ATX7006 system. Also applications like: Power meter testing, MRI amplifier test, Quantum effect research, etc. will benefit from the outstanding analog performance of the WFD22.
Block Diagram
Key Features
- 1 MHz sample rate with 22 bit resolution
- Fully differential input with 10 ranges
- 100 MΩ low I-bias, 1 MΩ Ultra-low noise input
- 1.5 ppm typical linearity
- ±(25 µV + 10 ppm of range) absolute accuracy
- Selectable filters to reduce out-of-band noise
- -122 dB THD typical (f-in = 1 kHz)
- 105 dB SNR typical (DC- 500 kHz)
- Programmable DC-offset voltage
- For ATX series hardware platform
Downloads
Technical Specifications
General
Resolution | 22 bit |
Sample rate | 0 - 1 MHz |
Pattern depth | 32M words |
Input characteristics
Input impedance / mode | 100 MOhm low bias current mode / 1 MOhm low noise mode |
Input configuration | Differential / Single Ended (-Input to Gnd, Gnd-sense or DC offset) |
Input ranges (Vpp) | 0.425, 0.637, 0.850, 1.275, 1.70, 2.55, 3.40, 5.10, 6.80, 10.20 |
Input filters | Bypass, 40 kHz (4-pole Butterw.), 250 kHz (5-pole Butterworth), 500 kHz (7-pole elliptic) |
Bandwidth -3 dB (typical) | 1.1 MHz (5.10 Vpp range) |
0.1 dB flatness (typical) | 200 kHz (5.10 Vpp range) |
Input Common mode range | +/- 10.2 V |
Accuracy (DC-offset off, 100 ksps)
Absolute accuracy, ranges 1.70 - 10.2 Vp | ±(25 µV + 10 ppm of range) |
Absolute accuracy, ranges 0.425 - 1.275 Vp | ±(25 µV + 15 ppm of range) |
Non Linearity error | ±3 ppm of range (1.5 ppm typical) |
Input bias current (typical) | 1 pA in 100 MOhm mode / 50 nA in 1 MOhm mode |
Accuracy DC Offset
Resolution | 20 bit (10 µV) |
Voltage range | -5.1 V to +5.1 V |
DC-offset accuracy | ±(10 µV + 6 ppm of value) |
Non Linearity | ±3 ppm of range |
Dynamic characteristics
(conditions: 1 MOhm input mode, 1 MS/s, 500 kHz filter on)SNR (5 Vpp, 1 kHz input) | 99 dB (105 dB typical) |
SNR (5 Vpp, 10 kHz input) | 97 dB |
SNR (5 Vpp, 100 kHz input) | 93 dB |
SNR (1 kHz input, A-weighted) | 110 dB (BW 20 Hz - 20 kHz) |
THD (5 Vpp, 1 kHz input) | -115 dB (-122 dB typical) |
THD (5 Vpp, 10 kHz input) | -110 dB |
THD (5 Vpp, 100 kHz input) | -94 dB |
SFDR (5 Vpp, 1 kHz input) | 112 dB |
CMRR (typical) | 110 dB |
Clock & Trigger inputs
Input impedance | > 1 MOhm |
Threshold level | 3.3 V CMOS/TTL (5 V tolerant) |