Applicos at the International Test Conference 2015

Applicos participated in the International Test Conference 2015. The conference and show were very well attended, and we want to thank everybody that visited our booth to talk to us or to see our ATX7006 testing data converters live. Also, our poster session about Clock Source Jitter Cancelation drew good attendance with lively discussions. For all those that did not have the opportunity to join, click here to learn more or to download the poster.