Features
- Fully integrated data converter test solution
- Sample rates from DC up to 200MHz
- Unsurpassed signal quality and accuracy
- Coherent measuring by default
- Flexible and versatile digital IO
- Extended Analysis software included
- Static, Dynamic and Histogram testing
- Lua script for easy user test implementation
The ATX-Express is a fully integrated solution for testing ADCs, DACs and other Analog functions. It features the same signal quality and versatility as the ATX7006, but is limited to 5 slots. The ATX-Express is ideal for test labs that don't have a wide range of converters to test and therefore can settle with less slots. The ATX-Express is a single instrument for testing data converters. This saves the investment in various high end rack and stack instruments and writing proprietary software to control them.
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This means you can concentrate on testing your converters rather than fine-tuning the test set-up. The ATX-Express is capable of testing converters from 4 to 24-bit. Its versatile digital I/O makes interfacing to the DUT easy, even for embedded converters. The Single Reference Architecture improves the stability and reduces calibration effort. The backplane distributed clock ensures coherent measuring.
The ATX-Express can also be used as an add-on upgrade for ATE systems. Please see the ATX7006 documentation for more details.
INL / DNL measurement of a 14-bit / 65Msps ADC
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| General specifications: |
| - 4U high Case Frame with integrated air cooling |
| - Power supplies, 115 / 230VAC |
| - Controller module running Windows™ XP embedded |
| - Ethernet and USB communication ports |
| - Built-in signal generation and error calculations for production measurements |
| - ATView Analysis software for Engineering and Qualification purposes (for Windows PC) |
| Standard configuration: Digital-IO module, 20-bit AWG, Dual Reference Source. |
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ATX-Express inside, screened modules, linear power supplies.
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Summary of modules specifications:
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AWG20 module
| Resolution |
20 bit |
| Update rate (max.) |
2Msps |
| Pattern depth |
4M-words |
| Output ranges (Vpp, SE) |
80mV to 10.24V in x2 steps |
| Common mode voltage |
-5V to + 5V (20-bit resolution) |
| Output configuration |
Differential, Single Ended, 50Ohm |
| Output filters |
None, 200kHz, 40kHz, 12kHz, 1.2kHz |
| Absolute accuracy |
±(40µV + 10ppm of range) |
| Non Linearity |
±8ppm of range (4ppm typical) |
| SNR (1kHz, 5Vpp) |
92dB (BW= DC-800kHz) |
| THD (1kHz, 5Vpp) |
-108dB (-115dB with 1.2kHz filter on) |
| THD (10kHz, 5Vpp) |
-106dB |
| SFDR (1kHz, 5Vpp, 1.67Ms) |
108dB (no filter) |
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WFD20 module
| Resolution |
20 bit |
| Sample rate (max.) |
2Msps |
| Capture memory |
4M-words |
| Input ranges (Vpp) |
0.544V to 8.16V in 8 ranges |
| DC offset voltage |
-5V to + 5V (19-bit resolution) |
| Input configuration |
differential or single, 100MOhm / 35pF |
| Input filters |
Bypass, 800kHz, 250kHz, 40kHz |
| Non Linearity |
±(40µV + 10ppm of range) |
| Relative accuracy (INL) |
±8ppm of range (3ppm typical) |
| SNR (1kHz, 5Vpp) |
93dB (BW= DC-800kHz) |
| THD (1kHz, 2Vpp) |
-110dB |
| THD (10kHz, 2Vpp) |
-106dB |
| SFDR (1kHz, 2Vpp, 1.67Ms) |
108dB (no filter) |
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AWG16 module
| Resolution |
16 bit |
| Update rate (max.) |
200Msps DIO clk/400Msps ext. clk |
| Pattern depth |
8M-words |
| Output ranges Single Ended |
480mVpp to 5.12Vpp in 8 ranges |
| Output ranges Differential |
960mVpp to 10.24Vpp in 8 ranges |
| Common mode voltage |
-2.56 to +2.56V (16-bit resolution) |
| Output configuration |
Differential or single ended, 50Ohm |
| Output filters |
None, 60MHz, 30MHz, 15MHz |
| Absolute accuracy |
±(500µV+0.08% of range) |
| SNR (fs=200Ms,fout=1MHz) |
70dB (BW DC-100MHz) |
| THD (fs=200Ms,fout=1MHz) |
-87dB |
| SFDR (fs=200Ms,fout=1MHz) |
88dB |
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WFD16 module
| Resolution |
16 bit |
| Sample rate |
1Msps - 180Msps |
| Capture memory |
8M-words |
| Input ranges (Vpp) |
0.512Vpp to 7.688Vpp in 16 ranges |
| Input impedance |
50O or 10kOhm/25pF |
| Input configuration |
Differential/single ended, AC/DC |
| Input filters |
Bypass, 60MHz, 30MHz, 15MHz |
| Absolute accuracy |
±(800µV+0.1% of range) |
| Non Linearity |
±0.006 of range |
| SNR (fs=160Ms,fout=1MHz) |
70dB (BW DC-80MHz) |
| THD (fs=160Ms,fout=1MHz) |
-89dB |
| SFDR (fs=160Ms,fout=1MHz) |
90dB |
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DRS20 |
DPS16 |
| No. of outputs |
2 |
2 |
| Resolution |
20-bit |
16-bit |
| Settling time |
20ms |
10ms |
| Output configuration |
2 or 4-wire |
2 or 4-wire |
| Output range |
±10V |
±12V |
| Accuracy |
±(25µV+10ppm.Vo) |
±(4mV+0.2%.Vout) |
| Noise (DC- 100kHz) |
5µVrms (typical) |
18µVrms (typical) |
| Output current |
10mA |
200mA |
| Current limit range |
n.a. |
10mA - 200mA |
| Voltage readback |
24-bit (DVM function) |
16-bit (volt¤t) |
| V-out modulation |
n.a. |
1mHz - 1kHz |
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Digital-IO module
| Data In- Outputs |
20-bit parallel, 24-bit serial |
| Data IO Formats |
parallel, byte by byte, serial |
| Capture / Stimuli memory |
4Mword x 24 bits |
| Maximum data rate |
50MHz (low speed mode) |
| Pattern generator |
100MHz, 64kword x 16 bits |
| Digital I/O levels |
1.2V to 3.3V/5V CMOS |
| High Speed Mode: |
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| Data source / capture rate |
200MHz (max.) |
| External clock rate |
400MHz (max.) |
| Capture / Stimuli memory |
8Mword x 16 bits |
| Digital I/O levels |
LVDS (or converter board) |
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SPECIFICATIONS ARE SUBJECT TO CHANGE WITHOUT NOTIFICATION
For more details, please visit our dedicated website www.atx7006.com
Watch the Data Converter Tester introduction video »
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