Applicos

The ATX-Hybrid is a fully integrated solution for testing ADCs, DACs and other analog functions. To extend the flexibility of the well-known ATX7006 even more, the ATX-Hybrid has 6 user-assignable PXI slots. These slots can be used to install modules to expand the ATX capabilities with functions like complex digital patterns, PMU measurements, high voltage or high current applications, Switch matrices, etc. This allows turning the ATX-Hybrid into a full function test system. Traditionally data converters are tested using a whole stack of bench instruments, filters and switch matrices. The ATX-Hybrid replaces all of that and more due to the easy hardware extendibility.

The ATX- slots of the ATX-Hybrid have the same capabilities and unparalleled signal performance as the ATX7006. This section has linear regulated supplies and an adapted bus to keep noise as low as possible. It is capable of testing converters from 4 to 24-bit. Its versatile digital I/O makes interfacing to the DUT easy, even for embedded converters. The Single Reference Architecture improves the stability and reduces calibration effort. The backplane distributed clock ensures coherent measuring.

The ATX-Hybrid can also be used as an add-on upgrade for ATE systems.

INL / DNL measurement of a 14-bit / 65Msps ADC

General

The ATX-Hybrid is a modular system that has a 7 slot ATX- section for high performance analog measurements like Data Converter Testing, and a 6 slot PXI section that allows the user to benefit from the many general-purpose PXI-modules available in the market . By bridging clocks and triggers between the two sections, a full integration between ATX- and PXI resources is achieved. The ATX-Hybrid measures Data Converters just as easy as Opamps, Filters, and other analog functions and with the PXI section it can also fully test the digital functionality of a device or board. Further PXI extensions open up almost unlimited measurement capabilities, all within the same test set-up.

The system controller is a standard PXI System Controller. The user may balance cost and performance with this. As a standard we supply the NI PXI-8101 controller module.

Performance

When designing the ATX-Hybrid we had two important goals in mind: minimum system noise and maximum flexibility. It therefore has linear power supplies for the analog section and thorough Shielding and Grounding to maintain analog signal integrity, even in a harsh production environment. The DIO module can provide a very low jitter sample clock that can be distributed to all other modules and to the DUT.

In the ATX section the standard 20-bit Generator and Digitizer modules offer an outstanding combination of µVolts-level of DC accuracy and a dynamic performance better than 106dB at sample rates up to 2Msps. For higher frequencies there are various modules with up to 400Msps sample rate. The ATX- section features auto-calibration and built-in self-test.

Software

The ATX section of the ATX-Hybrid is a command driven system that can easily be controlled from almost any programming environment.

Command level communication with the ATX-Hybrid using ATCom (ID request and measure voltage at DRS channel1)

With ATCom commands can be sent and results read. This allows testing command sequences before implementing them in software. LabVIEW drivers are also available. The PXI modules can be controlled using card drivers or any other solution you have, just like any other PXI environment.

ATView

The ATX-Hybrid comes with ATView, a sophisticated software package for configuring, programming and controlling the ATX-Hybrid and analyzing the results.

Example of ATView instrument panels

Setting up a test is just a matter of filling in the fields of the instrument panels, program a digital pattern if applicable, and press the START button. After a test the results are viewed in the WaveAnalyzer. The WaveAnalyzer can show the results of time domain, frequency domain and histogram tests. Zoom, stack, and cursor functions are available at any level.

Stacked linearity result of two different 16-bit DAC devices

When saving test results all settings are included. So when reviewing the results later, there never has to be any doubt about the exact conditions. Results and settings are stored in human-readable XML format which allows easy user processing. Export in CVS format is possible and graphs can be saved as images for easy importation into reports.

Dynamic result of a 14-bit/70Msps ADC

Test Methods

All standard data converter test methods are supported. Dynamic parameters are measured with sine waves and the results can be analyzed in time domain as well as in frequency domain. Static parameters can be measured with direct ramp testing or with histogram testing. Histogram testing is supported for ramp, triangle and sine wave signals.

Example of a digital pattern, editable with the mouse or a script