INL / DNL measurement of a 14-bit / 65Msps ADC

The ATX-Hybrid is a fully integrated solution for testing ADCs, DACs and other analog functions. To extend the flexibility of the well-known ATX7006 even more, the ATX-Hybrid has 6 user-assignable PXI slots. These slots can be used to install modules to expand the ATX capabilities with functions like complex digital patterns, PMU measurements, high voltage or high current applications, Switch matrices, etc. This allows turning the ATX-Hybrid into a full function test system. Traditionally data converters are tested using a whole stack of bench instruments, filters and switch matrices. The ATX-Hybrid replaces all of that and more due to the easy hardware extendibility.

The ATX- slots of the ATX-Hybrid have the same capabilities and unparalleled signal performance as the ATX7006. This section has linear regulated supplies and an adapted bus to keep noise as low as possible. It is capable of testing converters from 4 to 24-bit. Its versatile digital I/O makes interfacing to the DUT easy, even for embedded converters. The Single Reference Architecture improves the stability and reduces calibration effort. The backplane distributed clock ensures coherent measuring.

The ATX-Hybrid is also ideally suited as an add-on upgrade for ATE systems.

Architecture

The ATX-Hybrid is a modular system that has a 7 slot ATX- section for high performance analog measurements like Data Converter Testing, and a 6 slot PXI section that allows the user to benefit from the many general-purpose PXI-modules available in the market . By bridging clocks and triggers between the two sections, a full integration between ATX- and PXI resources is achieved. The ATX-Hybrid measures Data Converters just as easy as Opamps, Filters, and other analog functions and with the PXI section it can also fully test the digital functionality of a device or board. Further PXI extensions open up almost unlimited measurement capabilities, all within the same test set-up.

The system controller is a standard PXI System Controller. This allows the user to balance cost and performance. The default supplied controller is the NI PXI-8101.

Performance

When designing the ATX-Hybrid we had two important goals in mind: minimum system noise and maximum flexibility. It therefore has linear power supplies for the analog section and thorough Shielding and Grounding to maintain analog signal integrity, even in a harsh production environment. The DIO module can provide a very low jitter sample clock that can be distributed to all other modules and to the DUT.

In the ATX section the standard 20-bit Generator and Digitizer modules offer an outstanding combination of µVolts-level of DC accuracy and a dynamic performance better than 106dB at sample rates up to 2Msps. For higher frequencies there are various modules with up to 400Msps sample rate. The ATX- section features auto-calibration and built-in self-test.

Software

Command level communication with
the ATX-Hybrid using ATCom
(ID request and measure voltage at DRS channel1)

The ATX section of the ATX-Hybrid is a command driven system that can easily be controlled from almost any programming environment. With ATCom commands can be sent and results read. This allows testing command sequences before implementing them in software. LabVIEW drivers are also available. The PXI modules can be controlled using card drivers or any other solution you have, just like any other PXI environment.

ATView

Example of ATView instrument panels

The ATX-Hybrid comes with ATView, a sophisticated software package for configuring, programming and controlling the ATX-Hybrid and analyzing the results. Setting up a test is just a matter of filling in the fields of the instrument panels, program a digital pattern if applicable, and press the START button. After a test the results are viewed in the WaveAnalyzer. The WaveAnalyzer can show the results of time domain, frequency domain and histogram tests. Zoom, stack, and cursor functions are available at any level.

Stacked linearity result of two
different 16-bit DAC devices

When saving test results all settings are included. So when reviewing the results later, there never has to be any doubt about the exact conditions. Results and settings are stored in human-readable XML format which allows easy user processing. Export in CVS format is possible and graphs can be saved as images for easy importation into reports.

Test Methods

Dynamic result of a 14-bit/70Msps ADC

All standard data converter test methods are supported. Dynamic parameters are measured with sine waves and the results can be analyzed in time domain as well as in frequency domain. Static parameters can be measured with direct ramp testing or with histogram testing. Histogram testing is supported for ramp, triangle and sine wave signals.

Example of a digital pattern,
editable with the mouse or a script

ATX Series Comparison

Feature ATX7006A ATX Express ATX Hybrid
Controller module ATX controller ATX controller NI PXI controller
GPIB port Yes No -
Production calculations on controller module: FFT, linearity calculations, etc. Yes No -
DIO module slots 1 1 1
Analog module slots 8 4 6
PXI module slots - - 6
Low-jitter backplane design Improved Standard Standard
Supported modules:
DIO Yes Yes Yes
DIO-II Yes Yes Yes
DRS20 Yes Yes Yes
DPS16 Yes Yes Yes
AWG22 Yes Yes Yes
AWG20 Yes Yes Yes
AWG18 Yes No* No*
AWG16 Yes Yes Yes
WFD22 Yes Yes Yes
WFD20 Yes Yes Yes
WFD16 Yes Yes Yes
* Can be made available upon request, but with limitations. Contact Applicos for details.

Key Features

  • Fully integrated data converter test solution
  • Sample rates from DC up to 200MHz
  • Seven ATX-style slots and six PXI slots
  • Full synchronization between ATX- and PXI
  • Flexible and versatile digital IO
  • Extended Analysis software included
  • Static, Dynamic and Histogram testing
  • Lua script for easy user test implementation

Technical Specifications

General specifications

Test fixture with 5 analog signal connections

  • 19" Case Frame, 4U high, with integrated air cooling
  • 7 ATX- style slots and 6 PXI slots
  • Standard PXI System Controller module
  • Built-in signal generation and error calculations for various analog measurements
  • ATView7006 Analysis software for Engineering and Qualification purposes (for Windows PC)
  • LABVIEW and LabWindows/CVI support for the ATX slots as well as the PXI slots.
  • Standard ATX-slot configuration: 20-bit AWG, 20-bit WFD, Dual Reference Source, Dual Power Supply and the Digital-IO module.

Arbitrary Waveform Generator Modules


AWG22 AWG20 AWG18 AWG16
Resolution / Update rate 22 bit / 2 MS/s 20-bit / 2 MS/s 18 bit / 300 MS/s
(600 MS/s, 1.2 GS/s)*
16 bit / 400 MS/s
(DIO II or ext.clock)*
Pattern memory depth 4M-words 4M-words 8M-words 8M-words
Output ranges (Vpp, SE) 80 mV to 10.20 V in x2 steps 80 mV to 10.24 V in x2 steps 580 mVpp to 6.56 Vpp in 8 range 480 mVpp to 5.12 Vpp in 8 ranges
Filters / DC offset voltage 8 filters (max.) /
-5.1 V to +5.1 V
8 filters (max.) /
-5.12 V to +5.12 V
6 filters /
-2.56 V to +2.56 V
15- 30- 60MHz /
-2.56 V to +2.56 V
Absolute accuracy ±(25 µV + 8 ppm of range) ±(40 µV + 10 ppm of range) ±(300 µV +0.02 % of range) ±(500 µV +0.08 % of range)
Non Linearity (INL) ±3 ppm of range (1.5 ppm typical) ±8 ppm of range (4 ppm typical) ±0.004 % of range ±0.003 % of range
THD / SNR -111 dB / 97 dB (@ 1 kHz) -108 dB / 92 dB (@ 1 kHz) -99 dB / 73 dB (@ 10 MHz) -87 dB / 70 dB (@ 1MHz)

*Update rates > 200MHz require DIO II or an external clock source

Waveform Digitizer Modules


WFD20 WFD16
Resolution / Sample rate 20 Bit / 2 MS/s 16 Bit / 180 MS/s
Capture memory depth 4M-words 8M-words
Input ranges (Vpp) 0.544 V to 8.16 V in 8 ranges 0.512 Vpp to 7.688 Vpp in 16 ranges
Filters / DC offset voltage 800 kHz, 250 kHz, 40 kHz /
-5 V to +5 V
15- 30 MHz 60 MHz / equal to input range
Absolute accuracy ±(40 µV + 10 ppm of range) ±(800 µV + 0.1 % of range)
Non Linearity (INL) ±8 ppm of range (3 ppm typical) ±0.006 % of range
THD / SNR -110 dB / 93 dB (@ 1 kHz) -89 dB / 70 dB (@ 1 MHz)

DC Modules


DRS20 DPS16
Outputs / res. / settl. 2 ch. / 20 Bit / 20 ms 2 ch. / 16 Bit / 10 ms
Output range / config. ±10 V / 2 or 4-wire ±12 V / 2 or 4-wire
Accuracy ±(25 µV + 10 ppm. Vout) ±(4 mV + 0.2 %. Vout)
Noise (DC- 100 kHz) 5µ Vrms (typical) 18µ Vrms (typical)
Output current 10 mA 200 mA
Voltage readback 24 Bit (DVM function) 16 Bit (volt & current)
V-out modulation n.a. 1 mHz - 1 kHz

DIO & DIO II Modules


DIO & DIO II
Data In- Outputs 20 / 24 Bit, parallel, byte-byte, serial
Capture & Stimuli memory 8M-word x 16 or 4M-word x 24 Bits
Max. data & clock rate 50 MHz LS mode / 200 MHz HS mode
DIO II max. clock rate 600 MHz on backplane / 1 GHz front
Digital I/O levels 1.2 V - 3.3 V / 5 V CMOS & LVDS
Clock jitter (DIO II) 190 fs (typical @ 100 MHz)